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Analog value formation
Measurement principle
Integration and conversion
time/resolution per channel
Parameterized
Integration time in ms
Conversion time in ms
Resolution (incl. overrange/rep-
resentation in two's comple-
ment)
80mV
Type J
Type K
Type R
80mV
Type J
Type K
Type R
Interference voltage sup-
pression for interference
frequency f1 in Hz
ET 200L, ET 200L-SC and ET 200L-SC IM-SC Distributed I/O Device
EWA 4NEB 780 6009-02c
SC Analog Electronic Modules – T echnical Data
integrative
Input ranges (rated values)/in-
put resistance
yes
50
60
55
65
Permitted input voltage
for voltage input
(destruction limit)
Connection of sensors
S7 format
14 bit
Characteristic curve lineariza-
0.1 C/digit
tion
0.1 C/digit
0.1 C/digit
S5 format
Temperature compensation
13 bit
1 C/digit
1 C/digit
1 C/digit
50
60
Smoothing of measured values
Sensor Selection Data
For voltage measurement
Internal temperature com-
pensation
External temperature com-
pensation by means of a
compensating box looped
into the measuring circuit
Step
None
Weak
Medium
Strong
80 mV/>1M
Type J/1200 C/>1M
Type K/1372 C/>
1 M
Type R/1769 C/>
1 M
max.10 V permanent;
25 V for max. 1 s
(pulse duty factor 1:20)
possible
yes; parameterized
Type J, K, R to IEC
584
yes; parameterized
not possible
possible; one compen-
sating box per channel
yes; set by parameters
in 4 steps by digital fil-
tering
Time constant
1x cycle time
8x cycle time
64x cycle time
128x cycle time
12-43
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